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    Please use this identifier to cite or link to this item: http://140.128.103.80:8080/handle/310901/14396


    Title: A Model Analysis of the Temperature Dependence of Abnormal Resistivity in a Multi-walled Carbon Nanotube Interconnection
    Authors: Y. C. Yeh, L.W. Chan, H. Y. Miao, S. P. Chen and J.T. Lue
    Contributors: 東海大學電機系
    Date: 2010
    Issue Date: 2012-02-21T08:01:56Z (UTC)
    Publisher: 台中市:東海大學
    Relation: Nanotechnology Science and Applications, p.37-43
    Appears in Collections:[電機工程學系所] 期刊論文

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