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    Please use this identifier to cite or link to this item: http://140.128.103.80:8080/handle/310901/21812


    Title: The parameter extraction including field-plate effect of 0.25 νm 12 v LDMOSFETs
    Authors: Hu, C.-M., Lo, K.-H., Hung, C.-Y., Chu, C.-H., Chang, D.-C., Liu, J.-H., Gong, J., Huang, C.-F.
    Contributors: Department of Electrical Engineering, Tunghai University
    Keywords: Equivalent model;High-voltage signals;LDMOSFET;Measured results;Metal oxide semiconductor field-effect transistors;Parasitic components;Radio frequencies;RF applications;Signal paths;Simulated results;Small signal model;Source and drains
    Date: 2012
    Issue Date: 2013-05-15T09:06:11Z (UTC)
    Abstract: This paper presents the parameter extraction including the field-plate effect of a 0.25 νm 12 V lateral diffused metal-oxide-semiconductor field effect transistor (LDMOSFET). As LDMOSFET is capable of sustaining high-voltage signals between source and drain, it is appropriately used for power and radio frequency (RF) IC applications. For RF applications, a complete parameter extraction including the parasitic components of the devices used is necessary for accurately predicting the performance of the circuits. In this study, we propose a method to extract the parameters of the small-signal equivalent model containing the field-plate capacitance (C fp) of a LDMOSFET. The simulated results of this LDMOSFET RF small-signal model agree well with the measured results from 0.5 to 3 GHz. The extracted parameters show that the C fpforms an additional signal path which degrades the effective drain-side resistance and should be considered in RF applications. ? 2012 IOP Publishing Ltd.
    Relation: Semiconductor Science and Technology 27 (1) , art. no. 015017
    Appears in Collections:[電機工程學系所] 期刊論文

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