Tunghai University Institutional Repository:Item 310901/21972
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 21921/27947 (78%)
造访人次 : 4250710      在线人数 : 423
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://140.128.103.80:8080/handle/310901/21972


    题名: Study on the soft magnetic properties and high frequency characteristics of Co-M (M = Ti, Zr, and Hf) thin films??
    作者: Chang, H.W., Huang, Y.H., Hsieh, C.C., Shih, C.W., Chang, W.C., Xue, D.S.
    贡献者: Department of Physics, Tunghai University
    关键词: High frequency characteristics;Maximum values;Optimal properties;Soft magnetic properties;Ti content;Uniaxial magnetic anisotropy
    日期: 2012
    上传时间: 2013-05-15T09:08:26Z (UTC)
    摘要: Soft magnetic properties and high frequency characteristics of Co 100-xM x (M Ti, Zr, and Hf) thin films have been investigated. All M-doped Co 100-xM x films exhibit strong induced in-plane uniaxial magnetic anisotropy. With the increase of the x, the 4M s and coercivity along the hard and easy axes (H ch and H ce) are decreased, while H k reaches the maximum value for the films having the composition to become the fully amorphous. Among them, less Hf or Zr content, i.e., x = 7, are sufficient in forming the Co 100-xM x amorphous, in contrast, more Ti content, i.e., x 15, should be needed. The optimal properties of 4M s 11.0 kG, H ce 5.4 Oe, H ch 4.0 Oe, H k 320 Oe and f FMR 5.2 GHz for Co 93Hf 7 films and 4M s 11.7 kG, H ce 6.1 Oe, H ch 1.6 Oe, H k 266 Oe and f FMR 4.9 GHz for Co 93Zr 7 films can be obtained. ? 2012 American Institute of Physics.
    關聯: Journal of Applied Physics 111 (7) , art. no. 07A333
    显示于类别:[應用物理學系所] 期刊論文

    文件中的档案:

    档案 大小格式浏览次数
    index.html0KbHTML330检视/开启


    在THUIR中所有的数据项都受到原著作权保护.


    本網站之東海大學機構典藏數位內容,無償提供學術研究與公眾教育等公益性使用,惟仍請適度,合理使用本網站之內容,以尊重著作權人之權益。商業上之利用,則請先取得著作權人之授權。

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈