Tunghai University Institutional Repository:Item 310901/22072
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 21921/27947 (78%)
造訪人次 : 4242337      線上人數 : 696
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://140.128.103.80:8080/handle/310901/22072


    題名: A methodology for building effective test models with function nets??
    作者: Xu, D., Chu, W.
    貢獻者: Dept. of Computer Science, Tunghai University,
    關鍵詞: Formal methods;High-level petri nets;Model-based testing;Petri nets;Test generation
    日期: 2012-07-16
    上傳時間: 2013-05-15T09:10:07Z (UTC)
    出版者: Izmir; Turkey
    摘要: Building effective test models is critical to the applications of model-based testing. This paper presents a methodology for guiding model-based testing with function nets, which are lightweight high-level Petri nets. High-level Petri nets are traditionally used for modeling, simulation, and verification purposes. In this paper, however, function nets are test models for automated generation of test cases. The proposed methodology has three key features. First, based on an analogy between modeling and programming, it identifies the basic building blocks for composing test models. Second, it provides structured processes for building test models from workflows and from the contracts of the components under test. Third, it provides several techniques for reducing the complexity of test models and thus the number of tests. The methodology has been applied to the function testing and security testing of several industry-strength applications. ? 2012 IEEE.
    關聯: Proceedings - International Computer Software and Applications Conference , art. no. 6340166 , pp. 334-339
    顯示於類別:[資訊工程學系所] 會議論文

    文件中的檔案:

    檔案 大小格式瀏覽次數
    index.html0KbHTML176檢視/開啟


    在THUIR中所有的資料項目都受到原著作權保護.


    本網站之東海大學機構典藏數位內容,無償提供學術研究與公眾教育等公益性使用,惟仍請適度,合理使用本網站之內容,以尊重著作權人之權益。商業上之利用,則請先取得著作權人之授權。

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回饋