English  |  正體中文  |  简体中文  |  Items with full text/Total items : 21921/27947 (78%)
Visitors : 4200639      Online Users : 527
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://140.128.103.80:8080/handle/310901/28961


    Title: Searching for Rational Effect Factors of R&D Value within a Real Options Framework
    Authors: 曾俊堯
    Tseng, Chun-Yao
    Wu, Ming-Cheng
    Contributors: 東海大學企業管理學系
    Keywords: R&
    D value
    valuation
    real options
    B-S model
    research and development
    sensitivity analysis
    Taiwan
    electronics industry
    Date: 2010-03
    Issue Date: 2016-12-12T01:20:39Z (UTC)
    Abstract: Many academics and managers have confirmed the ability of real-option models to capture the value of flexibility in relation to R&D projects. However, few studies have focused on constructing empirical methods and testing their application to real circumstances. This study not only presents a sensitivity analysis of the R&D evaluation model, but also establishes an empirical analysis to examine these relationships using panel data on 101 Taiwanese electronics firms from 1991 to 2002. Based on the sensitivity analyses and empirical results, we conclude that the R&D value increases with increasing R&D capital, patent lifetime and risk-free rate.
    Relation: International Journal of Technology, Policy and Management, 10(1/2), 92-103
    Appears in Collections:[企業管理學系所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML305View/Open


    All items in THUIR are protected by copyright, with all rights reserved.


    本網站之東海大學機構典藏數位內容,無償提供學術研究與公眾教育等公益性使用,惟仍請適度,合理使用本網站之內容,以尊重著作權人之權益。商業上之利用,則請先取得著作權人之授權。

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback