Tunghai University Institutional Repository:Item 310901/3281
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 21921/27947 (78%)
Visitors : 4220240      Online Users : 636
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://140.128.103.80:8080/handle/310901/3281


    Title: 以失效模式與效應分析為基的製程問題分析模式-以奈米碳管背光模組為例
    Other Titles: An FMEA-Based Manufacturing Process Problem Analysis Model-Taking Carbon Nano-tube Back Light Unit for Example
    Authors: 方勇盛
    Fang, Yung-Sheng
    Contributors: 邱創鈞;蔡禎騰
    Chiou, Chuang-Chun;sai, Jen-Teng
    東海大學工業工程與經營資訊學系
    Keywords: 奈米碳管背光模組;失效模式與效應分析;故障樹;特性要因圖;模糊德菲法;模糊推論
    CNT-BLU、FMEA、FTA、Cause and Effect Diagram 、Fuzzy Delphi、Fuzzy Inference
    Date: 2006
    Issue Date: 2011-04-07T08:41:02Z (UTC)
    Abstract: 目前在政府重點投資的顯示器產業中,背光模組產業為最重要之下游產業。而奈米碳管背光模組更為取代現行背光模組中最具潛力的背光源選擇。但是截至目前為止,奈米碳管背光模組仍處於研發改善階段,因此會面臨到工程師在面對製程問題時只依照自身經驗判斷要因的問題,進而喪失寶貴的研發時間與成本。因此本研究以失效模式與效應分析理論為基本流程,結合故障樹分析、特性要因圖、模糊德菲法、模糊推論的觀念與分析手法,以奈米碳管背光模組為例,建構一個製程問題分析模式。本研究導入奈米碳管背光模組廠商提供之製程問題案例以進行本模式之推演驗證。結果發現經本模式得到之成果與廠商提供之主觀意見相差無幾,因此可說明本研究模式之合理性,也代表本模式可提供相關人員在奈米碳管背光模組製程問題分析上之參考。
    Among the display industry, one of the major investment targets of Taiwanese government at the present, the back light unit manufacturing is the most important downstream sector. Carbon Nano-tube Back Light Unit (CNT-BLU) is a highly potential product which can be used as the back light source in place of the current back light unit for display product. Until now, the development of CNT-BLU is still in the research and development stage. Therefore, the production of CNT-BLU encounters various process problems that are detected by engineers based on their experience. The processes of determining the causes of the manufacturing process problems usually take considerable time and cost in the R&D stage. This study constructs a CNT-BLU manufacturing process problem analysis model on the basis of failure mode and effect analysis (FMEA) which integrates the techniques of the fault tree analysis (FTA), cause and effect diagram, fuzzy Delphi and fuzzy inference. This study extensively reviews the literature related to the current problems of manufacturing process and showed the validity of the proposed model. After conducting a real-world case comparison, we find that the differences between the analytic result and the actual result are insignificant. From the results of this study, the capability of conducting process problem analysis of this model has been justified. The model also provides a useful tool for those who are interested in the analysis of CNT-BLU manufacturing process problems.
    Appears in Collections:[Department of Industrial Engineering and Enterprise Information] Theses and Dissertations

    Files in This Item:

    File SizeFormat
    094THU00030031-001.pdf7497KbAdobe PDF250View/Open


    All items in THUIR are protected by copyright, with all rights reserved.


    本網站之東海大學機構典藏數位內容,無償提供學術研究與公眾教育等公益性使用,惟仍請適度,合理使用本網站之內容,以尊重著作權人之權益。商業上之利用,則請先取得著作權人之授權。

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback